We thank Q. Zou and L. Zhu at Case Western Reserve University for assistance in dielectric measurement, J. H. Kim and J. Yao at Bruker Corporation and M. T. Wetherington at MCL of Penn State University for AFM–IR characterizations, P. O’Reilly of Molecular Vista for PiFM study, and L. Ding and Y. Yang at Penn State University for helpful discussion on SEM image analysis. We thank B. R. Alvarado at Penn State University for helpful discussion on theoretical calculation of dielectric constants in polymers. Q.M.Z. acknowledges the support of the Office of Naval Research under grant nos. N00014–23–1–2247, NSF DMR and Polymers Program (DMR-2413150) and the Harvey F. Brush Chair endowment in the College of Engineering of Penn State. L.L. was supported by the Office of Naval Research under grant no. N00014–23–1–2247. W.Z. was supported by the Office of Naval Research under grant nos. N00014–23–1–2247 (before September 2024 and in the summer of 2025), NSF DMR and Polymers Program (DMR-2413150) (between 1 September 2024 and 15 May 2025). W.L. and J.B. were supported by ONR grant no. N00014–23–1–2244. Supercomputing resources at the Oak Ridge Leadership Computing Facility were provided through the Innovative and Novel Computational Impact on Theory and Experiment (INCITE) program. Y.G. and S.H.K. were supported by Axalta Coating Systems. R.C. acknowledges the support of the Office of Naval Research (N0001425GI00541).