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1.

Electron microscopy shows 'mouse bite' defects in semiconductors (news.ycombinator.com)

2026-03-13 | by David Nutt | get SEM Inspection Kit → | tags: semiconductor defects, tsmc, electron microscopy

2.

Quantifying grain boundary deformation mechanisms in small-grained metals (feeds.nature.com)

2025-12-10 | by Gautier | get Grain Boundary Deformation Mechanism → | tags: boundaries, coupling, crystalline

3.

Chinese scientists discover method to cut defects by 99% with DUV chipmaking equipment, but it destroys EUV pattern fidelity — analyzing photoresist clustering with cryo-ET at 105°C (tomshardware.com)

2025-11-10 | by Anton Shilov | get UV Chipmaker → | tags: defects, developer, liquid

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