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Emerson's Ritu Favre warns chip and system complexity is outpacing verification tools

read original get Fluke 87V Industrial Digital Multimeter → more articles
GoKawiil Brief

Emerson's Test & Measurement business group president Ritu Favre argues that as chiplet-based designs and software-defined products grow more complex, verifying how combined components behave together has become far harder than testing them individually. She points to examples like cars and aircraft relying on thousands of interacting sensors and computer systems, where real-world behavior is increasingly difficult to predict.

Why It Matters

GoKawiil's interpretation of the reporting above, not reported fact.

As industries shift toward modular, multi-vendor hardware like chiplets, traditional component-level testing no longer guarantees system safety or reliability. This raises the stakes for measurement and verification technology providers like Emerson, since undetected interaction failures in cars, aircraft or semiconductors could have serious safety consequences.

Key Takeaways
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Source: spectrum.ieee.org — Ritu Favre, 2026-08-24

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